EO·Atlas
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  • Decomposes a mixed-pixel spectrum into the fractional abundances of its constituent endmember materials, resolving sub-pixel composition that a single hard class label cannot capture. Used to estimate vegetation, soil, and impervious-surface fractions.

  • Identifies surface materials by matching an observed reflectance spectrum against a reference library of known signatures, typically after continuum removal to isolate diagnostic absorption features. Used for mineral and surface-composition mapping from imaging spectrometers.

Sources
Methodology

Edited from public sources. Last reviewed date pending by SpectraWorks editorial. See the data dictionary for field definitions.

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